Title :
The results of precision microwave measurement of the internal parasitics of tunnel diodes
Author :
Bandler, John W.
fDate :
6/1/1968 12:00:00 AM
Keywords :
Cutoff frequency; Doping; Electrical resistance measurement; Gallium arsenide; Laboratories; Laser noise; Light emitting diodes; Microwave devices; Microwave measurements; Silicon;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1968.16278
