Title :
Evaluation of effective throughput rate for certain ATE architectures with data compaction/decompaction
Author :
Campbell, Steven R. ; Wagdy, Mahmoud Fawzy
Author_Institution :
RCA, Burlington, MA, USA
fDate :
3/1/1988 12:00:00 AM
Abstract :
Automatic test equipment (ATE) architectures for functional digital testing are presented. Formulas for effective throughput rate, refresh rate, burst rate, and compaction ratio are introduced to compare architectures. Methods and horizontal and vertical data compaction ratio are examined to determine the effect of compaction ratio on effective throughput rate
Keywords :
automatic test equipment; computer architecture; data compression; digital instrumentation; electronic equipment testing; ATE architectures; burst rate; compaction ratio; data compaction/decompaction; effective throughput rate; functional digital testing; horizontal data compaction ratio; refresh rate; vertical data compaction ratio; Automatic testing; Circuit testing; Clocks; Compaction; Electronic equipment testing; Logic testing; Pins; Sequential analysis; Test pattern generators; Throughput;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
