Title :
Highly sensitive measurements with a lens-focused reflectometer
Author :
Gagnon, David R.
Author_Institution :
US Naval Weapons Center, China Lake, CA, USA
fDate :
12/1/1991 12:00:00 AM
Abstract :
A lens-focused microwave reflectometer that offers exceptional sensitivity and very wide bandwidth is described. The system produces a well confined spot focus and, with the prescribed calibration procedure, gives effective directivity approaching 70 dB. Applications include dielectric constant measurements and scanned imaging of bodies. Precision of ±1 dB is demonstrated for measurements, in X-band, at the -50 dB level
Keywords :
calibration; microwave reflectometry; permittivity measurement; reflectometers; X-band; calibration procedure; dielectric constant measurements; lens-focused reflectometer; microwave reflectometer; scanned imaging; wide bandwidth; Calibration; Dielectric measurements; Focusing; Frequency; Lenses; Microwave imaging; Microwave measurements; Scattering; Surface waves; Transmission line measurements;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
