DocumentCode

1031800

Title

Interface trapping in unipolar space-charge-limited current

Author

Nicolet, M.A.

Volume

15

Issue

6

fYear

1968

fDate

6/1/1968 12:00:00 AM

Firstpage

427

Lastpage

427

Keywords

Bandwidth; Circuit testing; Continuous wavelet transforms; Copper; Equations; Heat sinks; Laboratories; Structural beams; Time sharing computer systems; Voltage;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1968.16303

Filename

1475205