Title :
Testing analogue circuits by power supply voltage control
Author :
A´Ain, A.K.B. ; Dorey, A.P.
Author_Institution :
Dept. of Eng., Lancaster Univ.
fDate :
2/3/1994 12:00:00 AM
Abstract :
By varying the power supply voltages of an analogue integrated circuit as a testing technique it is possible to expose faults within the circuits which are difficult to detect by conventional input voltage stimulation. This technique is simple to implement and does not incur any area overhead penalty
Keywords :
fault location; integrated circuit testing; linear integrated circuits; analogue integrated circuit; fault detection; input voltage; power supply voltage control; testing technique;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19940123
