• DocumentCode
    1032613
  • Title

    A "Fail-safe" circuit principle in semiconductor and solid-state systems

  • Author

    Fitzgerald, Alan S.

  • Author_Institution
    333 Corte Madera Avenue, Mill Valley, CA, USA
  • Volume
    2
  • Issue
    1
  • fYear
    1966
  • fDate
    3/1/1966 12:00:00 AM
  • Firstpage
    35
  • Lastpage
    38
  • Abstract
    This paper deals with the problem of securing greater safety from shock hazard due to leakage to ground in installations involving portable tools, swimming-pool wiring, and hydrotherapy equipment, and proposals for "built-in" protective systems. Criticism has been directed at the use of transistors on grounds of reliability, and it has been required that such a system must "fail safe." The construction and performance of a compact test model, a protective element embodying magnetic amplifiers and a single diode, which fails safe if the diode fails either as open circuit or as short circuit, is described. This device will handle the starting current of a half-horsepower motor and will disconnect a load with leakage current to ground of less than two milliamperes.
  • Keywords
    Ground-fault-interrupting circuit breakers; Magnetic amplifiers; Circuit testing; Electric shock; Hazards; Magnetic circuits; Proposals; Protection; Safety devices; Semiconductor diodes; Solid state circuits; Wiring;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1966.1065794
  • Filename
    1065794