DocumentCode
1032712
Title
A simple low-frequency thin-film magnetometer
Author
Aharoni, Amikam
Author_Institution
Purdue University, Lafayette, IN, USA
Volume
2
Issue
2
fYear
1966
fDate
6/1/1966 12:00:00 AM
Firstpage
76
Lastpage
78
Abstract
The usual way of plotting hysteresis curves involves the integration of
, which has many disadvantages at low frequencies, and calls for complicated and expensive instrumentation. The instrument described here is not as accurate as a good vibrating sample magnetometer, but is very simple, inexpensive, and easy to construct and to use. It involves no integration and therefore its operation is independent of the frequency of the applied magnetic field, and can be readily applied for observing time effects. The magnetic induction
is measured directly by a Hall probe placed in a 20-mil gap between two pieces of the same thin-film sample mounted in a 4-inch Varian magnet. A second Hall probe measures the applied field
, and by subtracting the voltages,
is plotted vs.
on an
recorder. With commercial Hall probes, the voltage obtained is sufficient to apply directly to commercial
recorders, without further amplification, even for rather thin films. At 100 mA through each of the probes, the
scale was 10μ V/Oe, while the M scale was 80μV/Mx.
, which has many disadvantages at low frequencies, and calls for complicated and expensive instrumentation. The instrument described here is not as accurate as a good vibrating sample magnetometer, but is very simple, inexpensive, and easy to construct and to use. It involves no integration and therefore its operation is independent of the frequency of the applied magnetic field, and can be readily applied for observing time effects. The magnetic induction
is measured directly by a Hall probe placed in a 20-mil gap between two pieces of the same thin-film sample mounted in a 4-inch Varian magnet. A second Hall probe measures the applied field
, and by subtracting the voltages,
is plotted vs.
on an
recorder. With commercial Hall probes, the voltage obtained is sufficient to apply directly to commercial
recorders, without further amplification, even for rather thin films. At 100 mA through each of the probes, the
scale was 10μ V/Oe, while the M scale was 80μV/Mx.Keywords
Hall effect devices; Magnetic films/devices; Magnetometers; Frequency; Hall effect devices; Instruments; Magnetic field measurement; Magnetic films; Magnetic hysteresis; Magnetometers; Probes; Transistors; Voltage;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1966.1065804
Filename
1065804
Link To Document