DocumentCode
1032829
Title
Design and characterization of a step-recovery switching transistor
Author
Lauritzen, Peter O. ; Brown, Douglas H.
Author_Institution
University of Washington, Seattle, Wash.
Volume
15
Issue
8
fYear
1968
fDate
8/1/1968 12:00:00 AM
Firstpage
569
Lastpage
576
Abstract
Fast rise time pulses can be generated with a special high-frequency silicon transistor structure having a collector impurity profile designed to control charge storage in the collector. When switched out of saturation it operates in a manner analogous to a step-recovery diode. The theory of operation is discussed along with the design and fabrication of the diffused impurity profiles. Its unique geometry combines planar and mesa technologies. Experimental transistors have a storage time of approximately 2-30 ns followed by a fall time as fast as 0.5 ns. The storage time can be adjusted by varying the initial base current or the driving pulse. The storage time and fall time are accurately characterized by the charge-control model. A transformer input circuit gives the best switching performance. Control devices of conventional planar structure fail to produce fast switching times. They demonstrate the failure of the charge-control model in describing the fall time of planar transistors in general.
Keywords
Circuit faults; Doping; Fabrication; Geometry; Impurities; Pulse generation; Pulse transformers; Semiconductor diodes; Silicon; Switches;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1968.16404
Filename
1475306
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