• DocumentCode
    1032829
  • Title

    Design and characterization of a step-recovery switching transistor

  • Author

    Lauritzen, Peter O. ; Brown, Douglas H.

  • Author_Institution
    University of Washington, Seattle, Wash.
  • Volume
    15
  • Issue
    8
  • fYear
    1968
  • fDate
    8/1/1968 12:00:00 AM
  • Firstpage
    569
  • Lastpage
    576
  • Abstract
    Fast rise time pulses can be generated with a special high-frequency silicon transistor structure having a collector impurity profile designed to control charge storage in the collector. When switched out of saturation it operates in a manner analogous to a step-recovery diode. The theory of operation is discussed along with the design and fabrication of the diffused impurity profiles. Its unique geometry combines planar and mesa technologies. Experimental transistors have a storage time of approximately 2-30 ns followed by a fall time as fast as 0.5 ns. The storage time can be adjusted by varying the initial base current or the driving pulse. The storage time and fall time are accurately characterized by the charge-control model. A transformer input circuit gives the best switching performance. Control devices of conventional planar structure fail to produce fast switching times. They demonstrate the failure of the charge-control model in describing the fall time of planar transistors in general.
  • Keywords
    Circuit faults; Doping; Fabrication; Geometry; Impurities; Pulse generation; Pulse transformers; Semiconductor diodes; Silicon; Switches;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1968.16404
  • Filename
    1475306