• DocumentCode
    1032841
  • Title

    A proposed punch-through microwave negative-resistance diode

  • Author

    Rüegg, Heinz W.

  • Author_Institution
    FASEC AG, Zurich, Switzerland
  • Volume
    15
  • Issue
    8
  • fYear
    1968
  • fDate
    8/1/1968 12:00:00 AM
  • Firstpage
    577
  • Lastpage
    585
  • Abstract
    A new microwave negative-resistance diode is proposed. The diode is similar to the Read diode insofar as the negative resistance is partially due to the finite transit time of carriers flowing through a depletion region. Unlike the Read diode, however, the carriers are injected into the depletion region by punch through rather than by avalanche. The resulting device is therefore expected to have a considerably better noise performance than the Read diode. The paper first explains qualitatively the punch-through operation of the proposed device and contrasts it with similar structures proposed earlier by Read and by Shockley. The large signal admittance of the punch-through diode is then obtained by using a sharp pulse approximation of the injection process. A device Q of -15 is calculated. Considering the device as a microwave oscillator, it is found that conversion efficiencies of the order of 20 percent should be possible. Estimates of the upper bounds on the microwave power are given. The paper concludes with a detailed account of design considerations for the device. Numerical designing examples for the frequency range of 1 to 5O GHz are given.
  • Keywords
    Charge carriers; Cutoff frequency; Electrons; Microwave devices; Microwave oscillators; P-n junctions; Semiconductor diodes; Signal processing; Upper bound; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1968.16405
  • Filename
    1475307