Comment on published carrier lifetime data on silicon-on-insulator (SOI) materials
Author :
Das, Krishanu
Author_Institution :
North Carolina State University, Department of Electrical & Computer Engineering, Raleigh, USA
Volume :
23
Issue :
11
fYear :
1987
Firstpage :
579
Keywords :
carrier lifetime; MOS capacitors; SOI; SOI structures; back interface; comment and reply; comparison of carrier lifetime data; diodes; generation lifetimes; published carrier lifetime data; recombination lifetimes;
