Title :
Avalanche injection currents and trapping phenomena in thermal SiO2
Author :
Nicollian, E.H. ; Goetzberger, A.
fDate :
9/1/1968 12:00:00 AM
Keywords :
Charge carrier processes; Conductivity; Current density; Electron emission; Electron traps; Ferroelectric materials; Insulation; Interface states; Laboratories; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1968.16432
