DocumentCode
1033098
Title
Avalanche injection currents and trapping phenomena in thermal SiO2
Author
Nicollian, E.H. ; Goetzberger, A.
Volume
15
Issue
9
fYear
1968
fDate
9/1/1968 12:00:00 AM
Firstpage
686
Lastpage
686
Keywords
Charge carrier processes; Conductivity; Current density; Electron emission; Electron traps; Ferroelectric materials; Insulation; Interface states; Laboratories; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1968.16432
Filename
1475334
Link To Document