DocumentCode
1033106
Title
Conduction of beam deposited electrons through SiO2
Author
Pickar, K.A.
Volume
15
Issue
9
fYear
1968
fDate
9/1/1968 12:00:00 AM
Firstpage
686
Lastpage
686
Keywords
Charge carrier processes; Conductivity; Electron beams; Electron emission; Electron traps; Ferroelectric materials; Insulation; Interface states; Laboratories; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1968.16433
Filename
1475335
Link To Document