Title :
Characterization of Refractive Index Distribution in Spherical Microlenses Fabricated by Deep Proton Writing
Author :
Kniazewski, P. ; Gomez, V. ; Pakula, A. ; Ottevaere, H. ; Kujawinska, M. ; Thienpont, H.
Author_Institution :
Warsaw Univ. of Technol. IMiF, Warsaw
Abstract :
In this letter, we present the results of the refractive index measurements on deep proton writing microlenses. The measurement method used is interferometric tomography. It is a nondestructive method for the determination of the 3-D internal refractive index distributions. The influence of the different fabrication steps on the refractive index distribution is discussed.
Keywords :
light interferometry; microlenses; nondestructive testing; optical fabrication; optical tomography; refractive index measurement; 3D internal refractive index distributions; deep proton writing; interferometric tomography; nondestructive method; refractive index measurements; spherical microlenses; Lenses; Microoptics; Optical device fabrication; Optical interferometry; Polymers; Protons; Refractive index; Temperature; Tomography; Writing; Deep proton writing (DPW) technology; interferometric tomography; microlens; refractive index distribution;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2007.913233
