Title :
Current oscillations in bulk Ge due to strain induced bulk negative differential conductivity
Author :
McGroddy, J.C. ; Nathan, M.I.
fDate :
9/1/1968 12:00:00 AM
Keywords :
Capacitive sensors; Conductivity; Dielectric constant; Electrons; Isolators; Microwave devices; Plasma temperature; Pulse measurements; Semiconductor waveguides; Stress;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1968.16458
