Title :
Index profiling of distributed-index lenses by a total reflection method
Author :
Zhu, X. ; Iga, K.
Author_Institution :
Tokyo Institute of Technology, Research Laboratory of Precision Machinery & Electronics, Yokohama, Japan
Abstract :
A simple index profiling method using total reflection is proposed. By a preliminary experiment, its accuracy was confirmed to be about 0.1% and its spatial resolution about 2¿m. The index profile of a planar microlens was measured and compared with theoretical calculations.
Keywords :
gradient index optics; lenses; light reflection; optical testing; refractive index measurement; 2 micron; distributed-index lenses; graded index components; index profiling method; optical testing; planar microlens; refractive index; spatial resolution; total reflection method;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19870448
