DocumentCode :
1033784
Title :
Double diffused high-speed germanium transistors
Author :
Gansauge, Peter
Author_Institution :
IBM Laboratory, Boeblingen/Wuertt, Germany
Volume :
15
Issue :
10
fYear :
1968
fDate :
10/1/1968 12:00:00 AM
Firstpage :
728
Lastpage :
731
Abstract :
It has been predicted that Ge transistors should exhibit faster switching speed than Si devices of comparable geometry, due to the higher electron and hole mobility in germanium. The development of techniques for the deposition of masking films and diffusion of donors and acceptors in Ge enables processing of double diffused planar transistors in a manner similar to those used in silicon. This paper describes and discusses these processes for both n-p-n and p-n-p transistors. The dc and high-frequency performance of these transistors reach expected values and indicate a superiority of germanium in high-speed performance.
Keywords :
Charge carrier processes; Electric breakdown; Electron devices; Electron mobility; FETs; Geometry; Germanium; Silicon; Snow; Solid state circuits;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1968.16505
Filename :
1475407
Link To Document :
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