• DocumentCode
    1033860
  • Title

    Shot noise in silicon Schottky barrier diodes

  • Author

    Cowley, A. Michael ; Zettler, Robert A.

  • Author_Institution
    hp associates, Palo Alto, Calif.
  • Volume
    15
  • Issue
    10
  • fYear
    1968
  • fDate
    10/1/1968 12:00:00 AM
  • Firstpage
    761
  • Lastpage
    769
  • Abstract
    Noise measurements have been performed on forward and reverse-biased silicon Schottky barrier diodes. Measurements were performed in the frequency range of 100 Hz to 50 kHz. Apart from excess noise observed for some diodes in a portion of this frequency range, the noise for the diodes was found to be in excellent agreement with shot-noise theory. Some refinements of the shot-noise theory have been considered, but the difference between the refined and the simple theories was not resolvable in our measurements. A useful noise-measurement technique is described.
  • Keywords
    Acoustical engineering; Contacts; Detectors; Electric breakdown; FETs; Feedback; Performance evaluation; Schottky barriers; Schottky diodes; Silicon;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1968.16512
  • Filename
    1475414
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1033860