Title :
A fast 2-D stability test procedure based on FFT and its computational complexity
Author :
Kurosawa, Kaoru ; Yamada, Isao ; Kokokawa, T.
Author_Institution :
Dept. of Electr. & Electron. Eng., Tokyo Inst. of Technol., Japan
fDate :
10/1/1995 12:00:00 AM
Abstract :
This note presents a fast stability test algorithm for two-dimensional (2D) systems which requires max {O(m2), O(mn 2 log2 mn), O(mn4)} multiplications to test the stability of 1/(1+Σi=0 i+jnΣ j=0 ≠0m bijz1iz2j)
Keywords :
circuit stability; computational complexity; fast Fourier transforms; transfer functions; two-dimensional digital filters; 2D digital filters; 2D stability test procedure; FFT; computational complexity; transfer functions; Computational complexity; Interpolation; Polynomials; Stability criteria; System testing; Transfer functions; Two dimensional displays;
Journal_Title :
Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on