Some annealing characteristics of electrodeposited permalloy wires

Experiments have been carried out to evaluate the aging characteristics of electrodeposited permalloy memory films. It has been demonstrated that a worst case memory program is necessary for this purpose, as more fundamental magnetic measurements cannot be directly related to the memory performance. Aging is accelerated by annealing the specimens at elevated temperatures. It is found that degradation occurs much more rapidly when the specimen is annealed in a hard direction magnetic field.