DocumentCode :
1034918
Title :
Nondestructive readout in thick magnetic film devices
Author :
Zappe, H.H.
Volume :
3
Issue :
1
fYear :
1967
fDate :
3/1/1967 12:00:00 AM
Firstpage :
2
Lastpage :
5
Abstract :
To study the nondestructive readout properties of thick magnetic film devices, sense voltages are computed for triangular interrogate word pulses. Eddy currents are assumed to be the exclusive damping mechanism. For a given pulse rise time one can obtain a maximum signal peak value with a given optimum film thickness, and the read signal of an optimized film can be approximated by simple analytical functions. In an attempt to describe the nondestructive readout stability, a relation is developed between pulse widths, angle of rotation of the magnetization, and reversibility threshold.
Keywords :
Magnetic film memories; NDRO memories; Damping; Eddy currents; Magnetic analysis; Magnetic films; Magnetic properties; Magnetization; Signal analysis; Space vector pulse width modulation; Stability; Voltage;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1967.1066015
Filename :
1066015
Link To Document :
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