DocumentCode :
1035002
Title :
Electrooptic effects between 20 and 120 microns
Author :
Johnson, C.J.
Volume :
16
Issue :
2
fYear :
1969
fDate :
2/1/1969 12:00:00 AM
Firstpage :
238
Lastpage :
239
Keywords :
Electrooptic effects; Frequency; High speed optical techniques; Laser mode locking; Lifetime estimation; Optical pulses; Pulse measurements; Sampling methods; Semiconductor lasers; Time measurement;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1969.16626
Filename :
1475668
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1035002
