Title :
High injection in epitaxial transistors
Author :
Poon, H.C. ; Gummel, H.K. ; Scharfetter, D.L.
fDate :
2/1/1969 12:00:00 AM
Keywords :
Charge carrier processes; Cutoff frequency; Delay effects; Doping profiles; Epitaxial layers; Equations; Kirk field collapse effect; Semiconductor process modeling; Telephony; Time sharing computer systems;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1969.16665
