DocumentCode :
1035494
Title :
Hall-effect devices
Author :
Epstein, Max
Author_Institution :
Northwestern University, Evanston, Ill
Volume :
3
Issue :
3
fYear :
1967
fDate :
9/1/1967 12:00:00 AM
Firstpage :
352
Lastpage :
359
Abstract :
The Hall effect and magnetoresistance in solids is discussed in terms of the Lorentz force on current carriers. The advances in thin-film high-mobility semiconductors are related to the increased utilization and developments of Hall-effect devices. The design of such devices depends, in most cases, on the associated magnetic structures. Several examples of applications of Hall-effect and magnetoresistive devices to measurements, communications, and controls are presented. Limitations in performance due to magnetic structures, current noise, and various other galvanomagnetic and thermomagnetic effects are discussed to indicate the range of capabilities of the devices.
Keywords :
Hall effect devices; Magnetoresistive devices; Hall effect; Hall effect devices; Lorentz covariance; Magnetic devices; Magnetic semiconductors; Magnetoresistance; Magnetoresistive devices; Semiconductor thin films; Solids; Thin film devices;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1967.1066071
Filename :
1066071
Link To Document :
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