• DocumentCode
    1036262
  • Title

    Effect of failure kinetics on time-to-failure distributions

  • Author

    Stewart, Robert G.

  • Author_Institution
    Lockheed Palo Alto Research Laboratory, Palo Alto, Calif.
  • Volume
    16
  • Issue
    4
  • fYear
    1969
  • fDate
    4/1/1969 12:00:00 AM
  • Firstpage
    401
  • Lastpage
    402
  • Abstract
    The kinetics or time dependence of a device quantity has an explicit effect on the time-to-failure distribution resulting from a given distribution of device degradation coeffecients. In particular, for nth power kinetics, the larger the value of n, the smaller the deviation from the mean.
  • Keywords
    Degradation; Equations; Failure analysis; Kinetic theory; Mechanical factors; Physics; Stress;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1969.16764
  • Filename
    1475806
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1036262