• DocumentCode
    1036379
  • Title

    Analysis of temperature-dependent optical gain in GaN-InGaN quantum-well structures

  • Author

    Witzigmann, B. ; Laino, V. ; Luisier, M. ; Schwarz, U.T. ; Fischer, H. ; Feicht, G. ; Wegscheider, W. ; Rumbolz, C. ; Lell, A. ; Härle, V.

  • Author_Institution
    Integrated Syst. Lab., Eidgenossische Tech. Hochschule, Zurich
  • Volume
    18
  • Issue
    15
  • fYear
    2006
  • Firstpage
    1600
  • Lastpage
    1602
  • Abstract
    The temperature dependent spectral gain in InGaN-GaN multiple quantum-well structures with 10% In content is investigated. Mode gain is measured in a temperature range between 239 K and 312 K using the Hakki-Paoli technique and compared to simulations. The simulation accounts for temperature-dependent polarization dephasing, and hence homogeneous broadening, in a rigorous fashion, without any fit parameter. It is found that the evolution of the gain spectrum with temperature at different drive currents can be modeled using a temperature-independent single value for inhomogeneous broadening. The resulting compositional fluctuations are compared to structural measurements
  • Keywords
    III-V semiconductors; gallium compounds; indium compounds; light emitting diodes; quantum well lasers; semiconductor quantum wells; spectral line broadening; wide band gap semiconductors; 239 to 312 K; GaN-InGaN quantum-well structures; Hakki-Paoli technique; InGaN-GaN; homogeneous broadening; inhomogeneous broadening; mode gain; polarization dephasing; Charge carrier density; Fluctuations; Indium; Light emitting diodes; Optical microscopy; Optical pumping; Quantum well devices; Quantum wells; Stimulated emission; Temperature; InGaN–GaN laser diode (LD); inhomogeneous broadening; microscopic gain model; optical gain;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2006.879565
  • Filename
    1658116