DocumentCode :
1036379
Title :
Analysis of temperature-dependent optical gain in GaN-InGaN quantum-well structures
Author :
Witzigmann, B. ; Laino, V. ; Luisier, M. ; Schwarz, U.T. ; Fischer, H. ; Feicht, G. ; Wegscheider, W. ; Rumbolz, C. ; Lell, A. ; Härle, V.
Author_Institution :
Integrated Syst. Lab., Eidgenossische Tech. Hochschule, Zurich
Volume :
18
Issue :
15
fYear :
2006
Firstpage :
1600
Lastpage :
1602
Abstract :
The temperature dependent spectral gain in InGaN-GaN multiple quantum-well structures with 10% In content is investigated. Mode gain is measured in a temperature range between 239 K and 312 K using the Hakki-Paoli technique and compared to simulations. The simulation accounts for temperature-dependent polarization dephasing, and hence homogeneous broadening, in a rigorous fashion, without any fit parameter. It is found that the evolution of the gain spectrum with temperature at different drive currents can be modeled using a temperature-independent single value for inhomogeneous broadening. The resulting compositional fluctuations are compared to structural measurements
Keywords :
III-V semiconductors; gallium compounds; indium compounds; light emitting diodes; quantum well lasers; semiconductor quantum wells; spectral line broadening; wide band gap semiconductors; 239 to 312 K; GaN-InGaN quantum-well structures; Hakki-Paoli technique; InGaN-GaN; homogeneous broadening; inhomogeneous broadening; mode gain; polarization dephasing; Charge carrier density; Fluctuations; Indium; Light emitting diodes; Optical microscopy; Optical pumping; Quantum well devices; Quantum wells; Stimulated emission; Temperature; InGaN–GaN laser diode (LD); inhomogeneous broadening; microscopic gain model; optical gain;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2006.879565
Filename :
1658116
Link To Document :
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