• DocumentCode
    1036393
  • Title

    High-sensitivity sampling technique for luminescence time constant measurement

  • Author

    Loualiche, S. ; Pauty, E.

  • Author_Institution
    CNET Lannion B, Lannion, France
  • Volume
    23
  • Issue
    19
  • fYear
    1987
  • Firstpage
    1017
  • Lastpage
    1019
  • Abstract
    A sampling method using fast photodetector diodes has been used for the first time to measure weak photoluminescence signals from AlxGa1¿xAs (x = 0.38) layers and GaAs/ AlGaAs (x = 0.33, 10 A°10 A°) superlattices. The method has a very high sensitivity of at least 20 photons/pulse and time resolution is limited only by the photodetector speed.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; photoluminescence; photometry; semiconductor superlattices; AlxGa1-xAs layers; GaAs-AlGaAs superlattices; fast photodetector diodes; luminescence time constant measurement; sampling method; semiconductors; sensitivity 20 photons/pulse; time resolution; weak photoluminescence signals;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19870713
  • Filename
    4258949
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1036393