• DocumentCode
    1036667
  • Title

    Partitioning for pseudo-exhaustive testing is NP-complete

  • Author

    Song, Wanjuan ; Smith, K.C. ; Snelgrove, W.M.

  • Author_Institution
    University of Toronto, Department of Electrical Engineering, Toronto, Canada
  • Volume
    23
  • Issue
    20
  • fYear
    1987
  • Firstpage
    1060
  • Lastpage
    1062
  • Abstract
    In the letter, two schemes of circuit partitioning for pseudo-exhaustive testing are described. The complexities of both are proved to be NP-complete.
  • Keywords
    VLSI; computational complexity; decidability; integrated circuit testing; logic testing; NP completeness; PI partitioning; VLSI circuit testing; circuit partitioning; complexities; gate partitioning; logic testing; pseudoexhaustive testing;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19870741
  • Filename
    4258978
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1036667