DocumentCode :
1036841
Title :
The effect of collector resistance upon the high current capability of n-p-ν-n transistors
Author :
Hahn, Larry A.
Author_Institution :
Texas Instruments Incorporated, Dallas, Tex.
Volume :
16
Issue :
7
fYear :
1969
fDate :
7/1/1969 12:00:00 AM
Firstpage :
654
Lastpage :
656
Abstract :
It is shown that the onset of conductivity modulation of the bulk collector resistance causes an abrupt decrease in hFEat high current density and consequently limits the current range in which a transistor exhibits usable gain. Data are presented which demonstrate the accurate measurement of equilibrium collector resistance from a curve-tracer display. Experimental results showing the effect of partial saturation upon transistor switching time are also presented. Recognition of this phenomenon suggests a reappraisal of the importance of other potential causes of high current hFEdecrease.
Keywords :
Conductivity; Current density; Displays; Electrical resistance measurement; Helium; Instruments; Iron; Transient response; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1969.16829
Filename :
1475871
Link To Document :
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