Title : 
The effect of collector resistance upon the high current capability of n-p-ν-n transistors
         
        
        
            Author_Institution : 
Texas Instruments Incorporated, Dallas, Tex.
         
        
        
        
        
            fDate : 
7/1/1969 12:00:00 AM
         
        
        
        
            Abstract : 
It is shown that the onset of conductivity modulation of the bulk collector resistance causes an abrupt decrease in hFEat high current density and consequently limits the current range in which a transistor exhibits usable gain. Data are presented which demonstrate the accurate measurement of equilibrium collector resistance from a curve-tracer display. Experimental results showing the effect of partial saturation upon transistor switching time are also presented. Recognition of this phenomenon suggests a reappraisal of the importance of other potential causes of high current hFEdecrease.
         
        
            Keywords : 
Conductivity; Current density; Displays; Electrical resistance measurement; Helium; Instruments; Iron; Transient response; Voltage;
         
        
        
            Journal_Title : 
Electron Devices, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/T-ED.1969.16829