Title :
Surface plasmon microscopy
Author :
Yeatman, Eric ; Ash, E.A.
Author_Institution :
Imperial College of Science & Technology, Department of Electrical Engineering, London, UK
Abstract :
The use of surface plasmon resonance measurements for the imaging of surfaces has been investigated. Images of dielectric patterns deposited on silver films are presented, with thickness sensitivity of about 3 Å and a lateral resolution of about 25¿m.
Keywords :
metallic thin films; optical microscopy; silver; surface plasmons; surface topography measurement; tungsten compounds; 25 micron; 3 A; WO3-Ag; dielectric patterns; imaging; lateral resolution; metallic films; surface plasmon microscopy; surface plasmon resonance measurements; thickness sensitivity;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19870762
