DocumentCode :
1037089
Title :
Kickback noise reduction techniques for CMOS latched comparators
Author :
Figueiredo, Pedro M. ; Vital, João C.
Author_Institution :
Chipidea Microelectron. SA, Porto Salvo, Portugal
Volume :
53
Issue :
7
fYear :
2006
fDate :
7/1/2006 12:00:00 AM
Firstpage :
541
Lastpage :
545
Abstract :
The latched comparator is a building block of virtually all analog-to-digital converter architectures. It uses a positive feedback mechanism to regenerate the analog input signal into a full-scale digital level. The large voltage variations in the internal nodes are coupled to the input, disturbing the input voltage-this is usually called kickback noise. This brief reviews existing solutions to minimize the kickback noise and proposes two new ones. HSPICE simulations of comparators implemented in a 0.18-μm technology demonstrate their effectiveness.
Keywords :
CMOS integrated circuits; analogue-digital conversion; comparators (circuits); integrated circuit noise; 0.18 micron; CMOS latched comparators; HSPICE simulations; analog input signal; analog-to-digital converter; full-scale digital level; kickback noise reduction; positive feedback mechanism; CMOS technology; Circuits; Degradation; Feedback; Inverters; Noise generators; Noise reduction; Power dissipation; Switches; Voltage; Analog–digital conversion; CMOS; kickback noise; latched comparator;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2006.875308
Filename :
1658186
Link To Document :
بازگشت