Title :
Automatic memory margin recorder and three-dimensional memory margin
Author :
Shimizu, Shogo ; Ito, Yu
Author_Institution :
Nippon Telegraph and Telephone Public Corporation, Tokyo, Japan
fDate :
9/1/1968 12:00:00 AM
Keywords :
Ferrite core memories; Assembly; Automatic testing; Circuit testing; Ferrites; Logic circuits; Magnetic cores; Magnetic materials; Telegraphy; Voltage; Writing;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1968.1066225
