Title :
Reconvergent fanout analysis and fault simulation complexity of combinational circuits
Author :
Maamari, Fadi ; Rajski, J.
Author_Institution :
McGill University, VLSI Design Laboratory, Department of Electrical Engineering, Montreal, Canada
Abstract :
The detectability of reconvergent fanout stem faults in a combinational logic circuit can be determined by explicitly simulating the faults within limited regions of the circuit. These regions are defined, and an estimate of the fault simulation complexity of the circuit is obtained. Results are presented for ten benchmark circuits.
Keywords :
combinatorial circuits; logic testing; combinational circuits; detectability; fault simulation complexity; reconvergent fanout analysis;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19870789
