DocumentCode
1037417
Title
Low-noise operation of buried channel MOS transistors
Author
Carruthers, C. ; Mavor, J.
Author_Institution
University of Edinburgh, Department of Electrical Engineering, Edinburgh, UK
Volume
23
Issue
22
fYear
1987
Firstpage
1173
Lastpage
1174
Abstract
Results are presented which show that extremely low-noise performance is possible in buried n-channel transistors. By careful choice of operating point, low-noise operation with useful gain is possible. The use of these devices as circuit elements is discussed.
Keywords
electron device noise; insulated gate field effect transistors; semiconductor technology; buried channel MOS transistors; low-noise operation; low-noise performance; n-channel transistors; operating point;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19870815
Filename
4259054
Link To Document