DocumentCode :
1037570
Title :
The influence of substrate topography on switching time of plated wire memory elements
Author :
Phillips, Richard J D ; Richards, Howard D. ; Stapleton, D.C.
Author_Institution :
Plessey Company Ltd., Caswell, England
Volume :
4
Issue :
3
fYear :
1968
fDate :
9/1/1968 12:00:00 AM
Firstpage :
345
Lastpage :
350
Abstract :
Indirect measurements have been made of the switching time during the write process of selected plated wire memory elements with different substrate topographies. Results are presented for nonmagnetostrictive Ni-Fe films of thickness 4000 ± 150 Å and anisotropy field 
Oe in a fixed switching field geometry. Switching time is found to increase as the substrate topography becomes rougher. This is accounted for by the influence of substrate topography on easy axis dispersion and domain wall motion threshold.
Oe in a fixed switching field geometry. Switching time is found to increase as the substrate topography becomes rougher. This is accounted for by the influence of substrate topography on easy axis dispersion and domain wall motion threshold.Keywords :
Magnetic film switching; Plated-wire memories; Coils; Glass; Magnetization; Measurement techniques; Pulse measurements; Stripline; Surfaces; Time measurement; Voltage; Wire;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1968.1066264
Filename :
1066264
Link To Document :
