DocumentCode :
1037601
Title :
New method of measurement of diode junction parameters
Author :
Coerver, L.E.
Volume :
16
Issue :
12
fYear :
1969
fDate :
12/1/1969 12:00:00 AM
Firstpage :
1082
Lastpage :
1083
Abstract :
An experimental technique for measuring the two parameters i0 and n of the diode equation ![i=i_{0}[\\exp (qV/nkT)-1]](/images/tex/15832.gif)
has been developed. The technique consists of determining n from the ratio of two average currents resulting from two sine waves being impressed-across the diode. Then the value of n is used to determine an amplitude of sine wave to relate i0 to the average current through a simple multiple. The values of n and i0 obtained by this method were compared with the same quantities obtained from the slope and intercept of a log i versus v plot. Standard deviation between methods of measuring n was 0.028. Standard deviation between methods of measuring log i0 was 0.01.
has been developed. The technique consists of determining n from the ratio of two average currents resulting from two sine waves being impressed-across the diode. Then the value of n is used to determine an amplitude of sine wave to relate iKeywords :
Charge measurement; Current measurement; Current-voltage characteristics; Electrons; Integral equations; Measurement standards; Q measurement; Semiconductor diodes; Temperature; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1969.16913
Filename :
1475955
Link To Document :
