DocumentCode
1037601
Title
New method of measurement of diode junction parameters
Author
Coerver, L.E.
Volume
16
Issue
12
fYear
1969
fDate
12/1/1969 12:00:00 AM
Firstpage
1082
Lastpage
1083
Abstract
An experimental technique for measuring the two parameters i0 and n of the diode equation ![i=i_{0}[\\exp (qV/nkT)-1]](/images/tex/15832.gif)
has been developed. The technique consists of determining n from the ratio of two average currents resulting from two sine waves being impressed-across the diode. Then the value of n is used to determine an amplitude of sine wave to relate i0 to the average current through a simple multiple. The values of n and i0 obtained by this method were compared with the same quantities obtained from the slope and intercept of a log i versus v plot. Standard deviation between methods of measuring n was 0.028. Standard deviation between methods of measuring log i0 was 0.01.
has been developed. The technique consists of determining n from the ratio of two average currents resulting from two sine waves being impressed-across the diode. Then the value of n is used to determine an amplitude of sine wave to relate iKeywords
Charge measurement; Current measurement; Current-voltage characteristics; Electrons; Integral equations; Measurement standards; Q measurement; Semiconductor diodes; Temperature; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1969.16913
Filename
1475955
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