• DocumentCode
    1037733
  • Title

    Impedance measurement of the illuminated metal—SiO2—Si diodes

  • Author

    Okamoto, Hiroshi

  • Volume
    17
  • Issue
    1
  • fYear
    1970
  • fDate
    1/1/1970 12:00:00 AM
  • Firstpage
    83
  • Lastpage
    85
  • Abstract
    Impedance measurement of light-illuminated MIS diodes was made. It becomes clear from the results that in the inversion region conductance of the MIS structure is more sensitive to illumination than its capacitance and that negative photoconductivity appears at low frequency, which is explained by the theory of Grosvalet et al.
  • Keywords
    Bridge circuits; Capacitance; Capacitors; Conductivity; Diodes; Electrodes; Frequency; Impedance measurement; Lighting; Photoconductivity;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1970.16928
  • Filename
    1476112
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1037733