DocumentCode
1037900
Title
RF defocusing of ion-focused electron beams
Author
Paik, S.F.
Volume
17
Issue
2
fYear
1970
fDate
2/1/1970 12:00:00 AM
Firstpage
168
Lastpage
169
Abstract
Ion-focusing of electron beams in high-power linear-beam microwave tubes is considered, and a qualitative discussion of the defocusing mechanism of an externally applied RF power is presented. The primary mechanism of beam breakup is the space-charge force of bunched electrons which limits the use of ion-focusing in high-power tubes.
Keywords
Electron beams; Electron mobility; Electron traps; Electron tubes; High power microwave generation; Microwave theory and techniques; Plasma density; Radio frequency; Space charge; Steady-state;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1970.16945
Filename
1476129
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