Title :
RF defocusing of ion-focused electron beams
fDate :
2/1/1970 12:00:00 AM
Abstract :
Ion-focusing of electron beams in high-power linear-beam microwave tubes is considered, and a qualitative discussion of the defocusing mechanism of an externally applied RF power is presented. The primary mechanism of beam breakup is the space-charge force of bunched electrons which limits the use of ion-focusing in high-power tubes.
Keywords :
Electron beams; Electron mobility; Electron traps; Electron tubes; High power microwave generation; Microwave theory and techniques; Plasma density; Radio frequency; Space charge; Steady-state;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1970.16945
