• DocumentCode
    1038336
  • Title

    Voltage shifts in the forward V-I characteristics of p-n-p-n power switches

  • Author

    Tserng, Hua-Quen

  • Volume
    17
  • Issue
    4
  • fYear
    1970
  • fDate
    4/1/1970 12:00:00 AM
  • Firstpage
    385
  • Lastpage
    386
  • Abstract
    The forward V-I characteristics of p-n-p-n power switches usually consist of one or more voltage shifts having negative resistance characteristics at small forward current. This phenomenon is attributed to local turning on of the switch due to shorted emitter and/or shorting dots used to enhance the dv/dt capability of the device, since lateral current flow plays a significant role in determining the V-I characteristics at small current, It is shown that the threshold current responsible for the voltage shift phenomenon has an empirical temperature dependence of the form I_{T} \\sim \\exp [- a(T - T_{0})] over the temperature range 20-125°C. The hysteresis loop associated with each negative resistance region can be explained in terms of the difference in turn-on current and holding current of a localized area in the vicinity of shorted emitter or shorting dots.
  • Keywords
    Current measurement; Hysteresis; Switches; Temperature dependence; Temperature distribution; Temperature measurement; Temperature sensors; Threshold current; Threshold voltage; Turning;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1970.16990
  • Filename
    1476174