DocumentCode
1038606
Title
Assessment of random and systematic errors in millimeter-wave dielectric measurement using open resonator and Fourier transform spectroscopy systems
Author
Afsar, Mohammed N. ; Moonshiram, Anusha ; Wang, Yong
Author_Institution
Dept. of Electr. & Comput. Eng., Tufts Univ., Medford, MA, USA
Volume
53
Issue
4
fYear
2004
Firstpage
899
Lastpage
906
Abstract
Assessment of random and systematic errors is performed for the first time on the real part of permittivity (ε´) and loss tangent (tanδ) of ceramics and polymers using two different measurement systems. Data measured from the full cavity length and the frequency variation techniques using the 60 GHz open resonator system and the millimeter-wave dispersive Fourier transform spectroscopy system (DFTS) are compared and analyzed. Data measured by the frequency variation technique were seen to be more accurate than those measured by the full cavity length variation technique with lower random errors for the specimens measured. The ε´ of the specimens measured by the frequency variation technique followed closely with those measured by the millimeter-wave DFTS system with a slight difference of about 0.02%. Finally, for all the specimens measured in this paper, the DFTS system was seen to provide much better accuracy for ε´ values. The frequency variation technique from the open resonator system generated the best tanδ.
Keywords
Fourier transform spectroscopy; ceramics; dielectric loss measurement; dielectric resonators; measurement errors; millimetre wave measurement; permittivity measurement; polymers; 60 GHz; cavity length variation technique; ceramics; dispersive Fourier transform spectroscopy system; frequency variation techniques; loss tangent; measurement systems; millimeter-wave dielectric measurement; open resonator; permittivity; polymers; random errors assessment; systematic errors assessment; Dielectric loss measurement; Dielectric measurements; Discrete Fourier transforms; Electrochemical impedance spectroscopy; Fourier transforms; Frequency measurement; Length measurement; Millimeter wave measurements; Millimeter wave technology; Permittivity measurement; FTS; Fourier transform spectroscopy; loss tangent; millimeter wave; open resonator system; permittivity;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2004.831145
Filename
1315962
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