DocumentCode :
103881
Title :
Highly Linear Fully Integrated Wideband RF PA for LTE-Advanced in 180-nm SOI
Author :
Francois, B. ; Reynaert, P.
Author_Institution :
Dept. of Electr. Eng., KU Leuven, Leuven, Belgium
Volume :
63
Issue :
2
fYear :
2015
fDate :
Feb. 2015
Firstpage :
649
Lastpage :
658
Abstract :
A highly linear fully integrated RF power amplifier (PA) for advanced long-term evolution (LTE-advanced) is fabricated in a 180-nm standard silicon-on-insulator process. To improve the linearity, several harmonic traps are introduced to minimize the second- and third-order harmonics, and hence, the third-order intermodulation distortion (IMD3). The impact on the linearity of the RF PA of each of the harmonic controls is studied and simulated. Finally, both the linearity of a standalone RF PA and an RF PA with proposed linearity enhancement circuitry is investigated by comparing their measured IMD3. For an LTE uplink signal with 20-MHz signal bandwidth and a 64-QAM 8.7-dB peak-to-average power ratio, the RF PA achieves 21.7% power-added efficiency (PAE) with 11-dB gain while delivering an average output power of 22.4 dBm in LTE-band VII. Simultaneously, the RF PA obeys the stringent spectral mask and the -30-dBc adjacent channel leakage ratio linearity requirement and achieves an error vector magnitude of only 4.05%. The linearized wideband RF PA is also verified for LTE-band I and achieves similar performance from 1.9 to 2.8 GHz. Thanks to the applied linearization technique, the proposed RF PA is able to transmit an LTE-advanced (release 12) signal with a carrier-aggregated bandwidth up to 60 MHz while satisfying the linearity requirements. For a 40-MHz (2 × 20 MHz) and 60-MHz (3 × 20 MHz) LTE-advanced signal at band VII, the RF PA produces an average output power of 19.2 and 17.6 dBm while achieving a PAE of 17.2% and 13.7%, respectively.
Keywords :
Long Term Evolution; UHF power amplifiers; intermodulation distortion; silicon-on-insulator; RF power amplifier; SOI; Si; advanced long-term evolution; applied linearization technique; bandwidth 20 MHz to 60 MHz; channel leakage ratio; frequency 1.9 GHz to 2.8 GHz; harmonic controls; harmonic traps; highly linear fully integrated wideband RF PA; linearity enhancement circuitry; peak-to-average power ratio; power- added efficiency; second-order harmonics; size 180 nm; standard silicon-on-insulator process; stringent spectral mask; third-order harmonics; third-order intermodulation distortion; Bandwidth; Harmonic analysis; Linearity; Logic gates; Long Term Evolution; Power generation; Radio frequency; AM–AM; AM–PM; Adjacent channel leakage ratio (ACLR); LTE-advanced; RF power amplifier (PA); band I; band VII; carrier aggregation (CA); harmonic traps; intermodulation distortion; linearization; long-term evolution (LTE); silicon-on-insulator (SOI); spectrum emission mask; third-order intermodulation distortion (IMD3); wideband;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2014.2380319
Filename :
6994302
Link To Document :
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