• DocumentCode
    1038888
  • Title

    Improved lower bounds on the reliability of hypercube architectures

  • Author

    Soh, Sieteng ; Rai, Suresh ; Trahan, Jerry L.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Louisiana State Univ., Baton Rouge, LA, USA
  • Volume
    5
  • Issue
    4
  • fYear
    1994
  • fDate
    4/1/1994 12:00:00 AM
  • Firstpage
    364
  • Lastpage
    378
  • Abstract
    The hypercube topology, also known as the Boolean n-cube, has recently been used for multiprocessing systems. The paper considers two structural-reliability models, namely, terminal reliability (TR) and network reliability (NR), for the hypercube. Terminal (network) reliability is defined as the probability that there exists a working path connecting two (all) nodes. There are no known polynomial time algorithms for exact computation of TR or NR for the hypercube. Thus, lower-bound computation is a better alternative, because it is more efficient computationally, and the system will be at least as reliable as the bound. The paper presents algorithms to compute lower bounds on TR and NR for the hypercube considering node and/or link failures. These algorithms provide tighter bounds for both TR and NR than known results and run in time polynomial in the cube dimension n, specifically, within time O(n2)
  • Keywords
    computational complexity; fault tolerant computing; hypercube networks; parallel architectures; reliability; Boolean n-cube; hypercube; hypercube architecture; hypercube topology; lower bounds; network reliability; node failure; path generation; reliability; reliability bounds; spanning trees; structural-reliability models; terminal reliability; tighter bounds; time O(n2); Computer architecture; Computer network reliability; Computer networks; Hypercubes; Joining processes; Military computing; Multiprocessing systems; Network topology; Performance analysis; Polynomials;
  • fLanguage
    English
  • Journal_Title
    Parallel and Distributed Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1045-9219
  • Type

    jour

  • DOI
    10.1109/71.273045
  • Filename
    273045