Title :
Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC
Author :
Pouget, Vincent ; Lewis, Dean ; Fouillat, Pascal
Author_Institution :
UMR CNRS, Univ. Bordeaux, Talence, France
Abstract :
This paper presents an experimental system for integrated circuit testing with a pulsed laser beam. The system is fully automated and simultaneously provides interesting spatial and temporal resolutions for various applications like fault injection, radiation sensitivity evaluation, or default localization. In the presented application, the system is used to visualize signal propagation in an 8-bit half-flash analog-to-digital converter.
Keywords :
analogue-digital conversion; automatic test equipment; integrated circuit testing; laser beam applications; analog-to-digital converter; default localization; integrated circuit testing; integrated circuits; pulsed laser beam; radiation sensitivity evaluation; signal propagation; time-resolved scanning; transient fault injection; Application specific integrated circuits; Circuit faults; Integrated circuit testing; Laser applications; Laser beams; Optical pulses; Pulse circuits; Signal resolution; Spatial resolution; Visualization; ADC; Analog-to-digital converter; fault injection; laser imaging; on-line testing; pulsed laser; single-event effects;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2004.831488
