Transient Response and Fixed Pattern Noise in Logarithmic CMOS Image Sensors

Logarithmic CMOS image sensors are appealing for their high-contrast and high-speed response but they require postprocessing to achieve high-quality images. Previously published work has explained the fixed pattern noise (FPN) in these image sensors using a steady-state analysis. This paper explains how the transient response of the readout circuit may also contribute to FPN. Thus, the performance of these CMOS cameras may be optimized with a proper understanding of the transient response, which is explained here through modeling and simulation with some experimental validation. In particular, the gain variation of a logarithmic camera is shown to be caused primarily by premature digitization. As logarithmic and linear active pixel sensors use similar circuits, some results in this paper, e.g., an analysis of readout capacitance, apply equally to the latter.