• DocumentCode
    1039410
  • Title

    A method for continuously measuring the pinch-off voltage shift of FET structures

  • Author

    Meirsschaut, S.

  • Volume
    17
  • Issue
    10
  • fYear
    1970
  • fDate
    10/1/1970 12:00:00 AM
  • Firstpage
    943
  • Lastpage
    944
  • Abstract
    A method is described for continuously measuring the pinch-off voltage VgTof FET structures as a function of time. This is of particular importance for the study of device instabilities.
  • Keywords
    Circuits; Dielectrics; Diodes; Electrons; FETs; Gunn devices; Microwave frequencies; Surface impedance; Time measurement; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1970.17101
  • Filename
    1476285
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1039410