Title :
Jitter Characteristic in Charge Recovery Resonant Clock Distribution
Author :
Mesgarzadeh, Behzad ; Hansson, Martin ; Alvandpour, Student Atila
Author_Institution :
Linkoping Univ., Linkoping
fDate :
7/1/2007 12:00:00 AM
Abstract :
This paper is focused on analysis and suppression of clock jitter in charge recovery resonant clock distribution networks. In the presented analysis, by considering the data-dependent nature of the generated jitter, the reason for the undesired jitter-peaking phenomenon is investigated. The analysis has been verified by measurements on a test chip fabricated in 0.13-mum standard CMOS process. The chip includes a fully integrated 1.5-GHz LC clock resonator with a passive (bufferless) clock distribution network, which directly drives the clocked devices in pipelined data path circuits. Furthermore, a jitter suppression technique based on injection locking is presented. Measurement results show about 50% peak-to-peak clock jitter reduction from 28.4 ps down to 14.5 ps after injection locking.
Keywords :
CMOS digital integrated circuits; clocks; jitter; resonators; CMOS process; LC clock resonator; charge recovery; clock jitter suppression; frequency 1.5 GHz; injection locking; jitter characteristic; resonant clock distribution; size 0.13 mum; time 14.5 ps; time 28.4 ps; CMOS process; Circuit testing; Clocks; Drives; Injection-locked oscillators; Integrated circuit measurements; Jitter; Measurement standards; Resonance; Semiconductor device measurement; Charge recovery resonant clocking; clock distribution network; jitter peaking; jitter suppression; low power;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2007.896691