DocumentCode
1039703
Title
A technique for measuring the dispersion characteristics in slow-wave circuits containing materials with nonreciprocal RF properties
Author
De Santis, C.
Volume
17
Issue
12
fYear
1970
fDate
12/1/1970 12:00:00 AM
Firstpage
1089
Lastpage
1090
Abstract
A traveling wave technique to measure the dispersion charateristics of slow-wave circuits is described which uses a sensitive phase measurement system and negates the requirment for shorting the circuit under test. Because of the elimination of the short and because the sensitivity of the measurement does not require strong coupling to the circuit fields, errors due to the creation of spurious modes are minimized. Comparison of wavelength measurements using this system with those of previous techniques show excellent agreement.
Keywords
Circuit testing; Dispersion; Electrical resistance measurement; Electrons; FETs; Phase measurement; Radio frequency; Resistors; Voltage; Wavelength measurement;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1970.17133
Filename
1476317
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