• DocumentCode
    1039703
  • Title

    A technique for measuring the dispersion characteristics in slow-wave circuits containing materials with nonreciprocal RF properties

  • Author

    De Santis, C.

  • Volume
    17
  • Issue
    12
  • fYear
    1970
  • fDate
    12/1/1970 12:00:00 AM
  • Firstpage
    1089
  • Lastpage
    1090
  • Abstract
    A traveling wave technique to measure the dispersion charateristics of slow-wave circuits is described which uses a sensitive phase measurement system and negates the requirment for shorting the circuit under test. Because of the elimination of the short and because the sensitivity of the measurement does not require strong coupling to the circuit fields, errors due to the creation of spurious modes are minimized. Comparison of wavelength measurements using this system with those of previous techniques show excellent agreement.
  • Keywords
    Circuit testing; Dispersion; Electrical resistance measurement; Electrons; FETs; Phase measurement; Radio frequency; Resistors; Voltage; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1970.17133
  • Filename
    1476317