Title :
AlGaInP-Based LEDs With AuBe-Diffused AZO/GaP Current Spreading Layer
Author :
Shoou-Jinn Chang ; Xu-Feng Zeng ; Shih-Chang Shei ; Shuguang Li
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Abstract :
We report the use of Al-doped ZnO (AZO) as the current spreading layer for AlGaInP-based light-emitting diodes (LEDs). It was found that AZO could form good ohmic contact with AuBe-diffused p-GaP. It was also found that the specific contact resistance could be further reduced from 2.68×10-4 to 1.52×10-4Ω-cm2 by performing rapid thermal annealing at 400 °C for 5 min in N2 ambient. Furthermore, it was found that output power of the LEDs with AZO current spreading layer was 6.2% larger than that of the LEDs with indium-tin-oxide current spreading layer. It was also found that LEDs with AZO current spreading layer also exhibit good electrical properties and good reliability.
Keywords :
aluminium compounds; gallium compounds; indium; light emitting diodes; nitrogen; ohmic contacts; oxygen; rapid thermal annealing; tin; zinc compounds; AlGaInP; GaP; ITO; LED; N2; ZnO:Al; current spreading layer; electrical properties; light-emitting diodes; ohmic contact; rapid thermal annealing; temperature 400 C; time 5 min; Annealing; Current measurement; Educational institutions; Films; Indium tin oxide; Light emitting diodes; Power generation; Al-doped zinc oxide; AlGaInP; AuBe diffused layer; CMEL; light-emitting diode;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.2013.2280065