Title :
Contact Resistance-The Contribution of Nonuniform Current Flow
Author :
Kouwenhoven, W.B. ; Sackett, W.T., Jr.
Author_Institution :
Dean of Engineering and Professor of Electrical Engineering at The Johns Hopkins University, Baltimore, Md.
fDate :
7/1/1951 12:00:00 AM
Keywords :
Area measurement; Contact resistance; Current measurement; Electrical resistance measurement; Fluid flow measurement; Immune system; Length measurement; Strips; Surface resistance; Welding;
Journal_Title :
American Institute of Electrical Engineers, Transactions of the
DOI :
10.1109/T-AIEE.1951.5060479
