DocumentCode :
1039867
Title :
The integral for multiplication factor M with single or equal ionization coefficients
Author :
Lauritzen, P.O.
Volume :
18
Issue :
1
fYear :
1971
fDate :
1/1/1971 12:00:00 AM
Firstpage :
73
Lastpage :
74
Abstract :
General expressions for the multiplication factor 
are derived for both step and linear graded junctions by integrating the common form for the ionization coefficient 
. Equal ionization coefficients are assumed. The results are compared with a commonly used approximation.
are derived for both step and linear graded junctions by integrating the common form for the ionization coefficient . Equal ionization coefficients are assumed. The results are compared with a commonly used approximation.Keywords :
Charge carrier processes; Electric breakdown; Gunn devices; Impurities; Ionization; Mean square error methods; Semiconductor diodes; Silicon;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1971.17149
Filename :
1476471
Link To Document :
