• DocumentCode
    1040018
  • Title

    Hardware Test Technology

  • Author

    Perkins

  • Volume
    12
  • Issue
    10
  • fYear
    1979
  • Firstpage
    7
  • Lastpage
    8
  • Abstract
    The testing of digital systems has grown increasingly complex. LSI circuits, commonplace in today´s systems, require thorough testing at the component level. VLSI adds even more complexity. How are these challenges being met? This special issue surveys the state-of-the-art and attempts to answer the question.
  • Keywords
    Analog computers; Circuit testing; Engineering management; Hardware; Logic testing; Memory management; Parallel processing; Reliability engineering; System testing; Technology management;
  • fLanguage
    English
  • Journal_Title
    Computer
  • Publisher
    ieee
  • ISSN
    0018-9162
  • Type

    jour

  • DOI
    10.1109/MC.1979.1658489
  • Filename
    1658489
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1040018